Atom Probe Tomography & Microscopy (APT&M) is a biannual international conference conducted under the aegis of the International Field Emission Society (IFES). The objective of IFES which is an international scientific society, is to promote high field nanoscience and atom probe microscopy. The erstwhile International Field Emission Symposium, originated in 1952 has now been renamed as APT&M. The conference brings together experts in the field of atom probe microscopy including, instrumentation, data treatment, novel materials' synthesis and analysis methods with the objective of enabling scientific interactions, sharing of best practice methods and application of knowledge base in future materials domains.

The aim of the conference is to gather scientists from the field emission, nanoscience, atom probe and correlative microscopy communities. The conference will cover various topics, including fundamental physics, simulation, instrumentation and advanced technological applications :

High Field Physics and Nanoscience:

Atom probe Tomography:

• Instrumentation and related physics
• Specimen preparation including correlative methods
• Data mining
• Image reconstruction
• Analysis of Metallic alloys
• Application to micro-electronic materials
• Nanostructured materials and advanced ceramics
• The symposia will include plenary sessions, keynote lectures and invited talks by international experts, along with sessions for oral presentations. Poster presentations and pre-conference workshops for intensive discussions and exchange of ideas and best practices.

"E.W. Müller Young Scientist Award" competition for the best orally-presented paper in the conference.